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Scanning Electron Microscopy of Plastics Failure
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$199.99
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Scanning electron microscopy (SEM) is often used in plastics failure analysis when light microscopy cannot provide images of high enough resolution. SEM images also provide higher contrast, in part...
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01 September 2010

Scanning electron microscopy (SEM) is often used in plastics failure analysis when light microscopy cannot provide images of high enough resolution. SEM images also provide higher contrast, in particular of surface textures. SEM is also advantageous with very dark surfaces and transparent materials. This book is an unrivaled comprehensive collection of SEM images covering topics such as surface properties, adhesion, joining, fracture, and other types of failure of plastic parts, which are of decisive importance for the economic success of plastics manufacturing operations.
Price: $199.99
Pages: 262
Publisher: Hanser Publications
Imprint: Hanser Publications
Publication Date:
01 September 2010
ISBN: 9781569905029
Format: Hardcover